41![HybriD™ Mode Atomic Force Microscopy (AFM) from NT-MDT - An Interview with Sergei Magonov HybriD™ Mode Atomic Force Microscopy (AFM) from NT-MDT - An Interview with Sergei Magonov Interview by Will Soutter HybriD™ Mode Atomic Force Microscopy (AFM) from NT-MDT - An Interview with Sergei Magonov HybriD™ Mode Atomic Force Microscopy (AFM) from NT-MDT - An Interview with Sergei Magonov Interview by Will Soutter](https://www.pdfsearch.io/img/dbef84c537e68fcad65196ce3e0d070b.jpg) | Add to Reading ListSource URL: www.ntmdt.comLanguage: English - Date: 2013-08-08 00:48:22
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42![AFM + Raman Microscopy + SNOM + Tip-Enhanced Raman: Instrumentation and Applications P. Dorozhkin,* E. Kuznetsov, A. Schokin, S. Timofeev, and V. Bykov NT-MDT Co., Build. 100, Zelenograd Moscow, [removed]Russia * dorozhkin AFM + Raman Microscopy + SNOM + Tip-Enhanced Raman: Instrumentation and Applications P. Dorozhkin,* E. Kuznetsov, A. Schokin, S. Timofeev, and V. Bykov NT-MDT Co., Build. 100, Zelenograd Moscow, [removed]Russia * dorozhkin](https://www.pdfsearch.io/img/cf1e390210e386c06ab97f0e47f15683.jpg) | Add to Reading ListSource URL: www.ntmdt.comLanguage: English - Date: 2012-07-13 02:47:38
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43![AFM for biological applications
LIFE setup and measuring head lifting mechanism Development of an AFM for biological applications is always a tricky problem because it requires AFM integration with an Inverted Light Mi AFM for biological applications
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44![Single-Pass Measurements in Atomic Force Microscopy Single-Pass Measurements in Atomic Force Microscopy: Kelvin Force Microscopy and Local Dielectric Studies NT-MDT Development Inc. 416 W. Warner Rd. Tempe AZ USA Single-Pass Measurements in Atomic Force Microscopy Single-Pass Measurements in Atomic Force Microscopy: Kelvin Force Microscopy and Local Dielectric Studies NT-MDT Development Inc. 416 W. Warner Rd. Tempe AZ USA](https://www.pdfsearch.io/img/161410286ebed718bf3c4367f42f5350.jpg) | Add to Reading ListSource URL: www.ntmdt.comLanguage: English - Date: 2013-10-09 06:55:25
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45![2.5 Ultimate resolution in the contact mode[removed]The effect of elastic deformations The AFM technique accuracy is limited by elastic deformations which modify a sample 2.5 Ultimate resolution in the contact mode[removed]The effect of elastic deformations The AFM technique accuracy is limited by elastic deformations which modify a sample](https://www.pdfsearch.io/img/d8ee67b65c3bf9b24f3485e05fab6ea5.jpg) | Add to Reading ListSource URL: www.ntmdt.comLanguage: English - Date: 2008-01-29 12:03:00
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46![Single-Pass Measurements in Atomic Force Microscopy Single-Pass Measurements in Atomic Force Microscopy: Kelvin Force Microscopy and Local Dielectric Studies NT-MDT Development Inc. 416 W. Warner Rd. Tempe AZ USA Single-Pass Measurements in Atomic Force Microscopy Single-Pass Measurements in Atomic Force Microscopy: Kelvin Force Microscopy and Local Dielectric Studies NT-MDT Development Inc. 416 W. Warner Rd. Tempe AZ USA](https://www.pdfsearch.io/img/48d2dada107864bfa84a2ff24719979c.jpg) | Add to Reading ListSource URL: ntmdt.comLanguage: English - Date: 2013-10-09 06:55:25
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47![Chapter 6: Materials Protection and Surface Technology Unique Test Facilities Electron microscope (ESEM) with integrated atomic force microscope (AFM) Keywords Chapter 6: Materials Protection and Surface Technology Unique Test Facilities Electron microscope (ESEM) with integrated atomic force microscope (AFM) Keywords](https://www.pdfsearch.io/img/c842cb4d7a23c36028eb9a220c5a86e4.jpg) | Add to Reading ListSource URL: www.bam.deLanguage: English - Date: 2015-02-04 09:11:40
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48![Graphene Comprehensive AFM / Optical / Raman / TERS* Characterization in the Single Experiment White light image of the graphene flake with AFM tip and Raman laser spot Graphene Comprehensive AFM / Optical / Raman / TERS* Characterization in the Single Experiment White light image of the graphene flake with AFM tip and Raman laser spot](https://www.pdfsearch.io/img/722fa3bc1b5d47d5d1c0f38ccab84940.jpg) | Add to Reading ListSource URL: ntmdt.comLanguage: English - Date: 2012-07-13 02:55:13
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49![NTEGRA Spectra: Pharmaceutical Application AFM-Raman Characterization of Pharmaceutical Tablets Compound Distribution Studies in Pharmaceutical Tablets by Integrated AFM-Raman Instrument NTEGRA Spectra: Pharmaceutical Application AFM-Raman Characterization of Pharmaceutical Tablets Compound Distribution Studies in Pharmaceutical Tablets by Integrated AFM-Raman Instrument](https://www.pdfsearch.io/img/f8508854d266c7c9fd72753ff8a7d8ae.jpg) | Add to Reading ListSource URL: www.ntmdt.comLanguage: English - Date: 2012-07-13 03:01:34
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50![NTEGRA Spectra: Pharmaceutical Application AFM-Raman Characterization of Pharmaceutical Tablets Compound Distribution Studies in Pharmaceutical Tablets by Integrated AFM-Raman Instrument NTEGRA Spectra: Pharmaceutical Application AFM-Raman Characterization of Pharmaceutical Tablets Compound Distribution Studies in Pharmaceutical Tablets by Integrated AFM-Raman Instrument](https://www.pdfsearch.io/img/a31c47bcdbc2bbf029d33012c511773c.jpg) | Add to Reading ListSource URL: ntmdt.comLanguage: English - Date: 2012-07-13 03:01:34
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